Measured parameter
| Analytical Method | Particle Size Range(μm) |
Length | optical microscope | >0.5 0.001~200 |
electron microscope | ||
Cross-sectional area, surface area
| optical microscope | >0.5
|
electron microscope | 0.001~200 | |
imager | >0.5
| |
sieving method | >3 | |
Light obscuration | 0.003~100 | |
Disk centrifugal sedimentation method | 0.02~30 | |
light blockage method | 1~100 | |
Electromigration classification
| 0.005~1 | |
volume ,mass | X-ray small Angle scattering method
| 0.003~0.5 |
Laser particle size analyzer | 0.05~8000 | |
gravity settling method | 1~100 | |
resistivity method | 0.5~100 | |
Dynamic light scattering method
| 0.003~10 | |
Diffusion cell
| 0.005~0.2 | |
Ultrasonic spectrum
| 0.01~100 |
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